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Results 1 to 25 of 7131

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Field emission characteristics of BCN nanofilmKIMURA, Chiharu; SHIMA, Hidekazu; OKADA, Kunitaka et al.International Vacuum Nanoelectronics Conference. 2004, pp 242-243, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Preparation and field emission properties of nanostructured CuO emittersLI, C. Y; HUANG, J. X; JUN CHEN et al.International Vacuum Nanoelectronics Conference. 2004, pp 128-129, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Synthesis and field emission properties of carbon nanosheetsJIANJUN WANG; MINGYAO ZHU; OUTLAW, Ron et al.International Vacuum Nanoelectronics Conference. 2004, pp 222-223, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Field emission of clean and oxidized Mo<110> microtipsZHAO, X; OUTLAW, R. A; CHAMPION, R. L et al.International Vacuum Nanoelectronics Conference. 2004, pp 96-97, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Transport and field-emission properties of carbon nanotubesMAYER, A; MISKOVSKY, N. M; CUTLER, P. H et al.International Vacuum Nanoelectronics Conference. 2004, pp 178-179, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Canon à emission de champ à lentille magnétique préaccélératrice = Preaccelerating magnetic lens field emission gunTROYON, M.Journal de microscopie et de spectroscopie électroniques. 1984, Vol 9, Num 2, pp 127-129, issn 0395-9279Article

Design and fabrication of field emission based pressure microsensorsBADI, N; HE, K; NAIR, A et al.International Vacuum Nanoelectronics Conference. 2004, pp 24-25, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Physical considerations of operating and characteristics modeling of nanostructural field emission devicesTATARENKO, Nikolai I; VOROBYEV, Andrey Yu.International Vacuum Nanoelectronics Conference. 2004, pp 84-85, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Influence of ion effects on field-emission-limited diodesLIN, Ming-Chieh.International Vacuum Nanoelectronics Conference. 2004, pp 130-131, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Field emission from polymer filmsIONOV, A. N; POPOV, E. O; SVETLICHNYI, V. M et al.International Vacuum Nanoelectronics Conference. 2004, pp 276-277, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Field emission from teepee-shaped carbon nanotube bundlesBUSTA, H; TOLT, Z; MONTGOMERY, J et al.International Vacuum Nanoelectronics Conference. 2004, pp 30-31, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

One of perspective directions of creation of highly effective field emission microdevices and microdisplaysMUKHUROV, Nikolay I; ZHDANOK, Sergey A; GASENKOVA, Irina V et al.International Vacuum Nanoelectronics Conference. 2004, pp 132-133, isbn 0-7803-8397-4, 1Vol, 2 p.Conference Paper

Field emission devices for space applicationsRÜDENAUER, Friedrich G.Surface and interface analysis. 2007, Vol 39, Num 2-3, pp 116-122, issn 0142-2421, 7 p.Conference Paper

FIELD EMISSION*FIELD-ION MICROSCOPY AS A TOOL FOR THIN FILM AND SURFACE STUDIESPOLLOCK HMM.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 14; NO 2; PP. 193-209; BIBL. 2 P.Serial Issue

Field emission 2000: proceedings of the 46th International Field Emission Symposium, Pittsburgh, PA, USA, 23-28 July 2000DANOIX, F; SEIDMAN, D. N.Ultramicroscopy. 2001, Vol 89, Num 1-3, issn 0304-3991, 220 p.Conference Proceedings

CARBON FIBRES AS FIELD EMITTERS.BRAUN E; SMITH JF; SYKES DE et al.1975; VACUUM; G.B.; DA. 1975; VOL. 25; NO 9-10; PP. 425-426; BIBL. 7 REF.Article

FIELD EMISSION*FIELD-ION MICROSCOPY AS A TOOL FOR THIN FILM AND SURFACE STUDIESPOLLOCK HMM.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 14; NO 2; PP. 193-209; BIBL. 2 P.Serial Issue

Emission stability of FEA microtipsNAKANE, H; YAMANE, K; MUTO, Y et al.Journal of the Society for Information Display. 2000, Vol 8, Num 3, pp 237-240, issn 1071-0922Conference Paper

Early field emission studies of semiconductorsFURSEY, G.Applied surface science. 1996, Vol 94-95, pp 44-59, issn 0169-4332Conference Paper

MICROSCOPIE IONIQUE A EFFET DE CHAMPVAN OOSTROM A.1973; ACTA ELECTRON.; FR.; DA. 1973; VOL. 16; NO 1; PP. 59-71; ABS. ALLEM.; BIBL. 14 REF.Serial Issue

MESURE DE LA DIFFUSION DE SURFACE PAR MICROSCOPIE A EMISSION DE CHAMPKERN R; DRECHSLER M.1973; DGRST-6901992; FR.; DA. 1973; PP. (30 P.); H.T. 11; ABS. ANGL.; BIBL. DISSEM.; (RAPP. FINAL, ACTION CONCERTEE: METALL.)Report

Study of the MgO-coated W emitters by field emission microscopyMOUSA, M. S; AL SHARE, M.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 195-202, issn 0304-3991Conference Paper

Field Emission '97 International Field Emission SymposiumHONO, K; TSUKADA, M.Ultramicroscopy. 1998, Vol 73, Num 1-4, issn 0304-3991, 305 p.Conference Proceedings

IFES'95: International Field Emission SymposiumMILLER, Michael K; KELLY, Thomas F; CAMUS, Patrick P et al.Applied surface science. 1996, Vol 94-95, issn 0169-4332, 532 p.Conference Proceedings

Emission microscope observation of FEAsNAKANE, H; YAMANE, K; MUTO, Y et al.Applied surface science. 1999, Vol 146, Num 1-4, pp 169-171, issn 0169-4332Conference Paper

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